Failure Analysis: High Technology Devices
Daniel J. D. Sullivan, Eric J. Carleton$78.19
$91.99
The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
Binding Type: Paperback
Publisher: de Gruyter
Published: 10/24/2022
ISBN: 9781501524783
Pages: 128
Weight: 0.48lbs
Size: 9.61h x 6.69w x 0.28d