European Test Workshop (Etw 2000) [Postproceedings]

IEEE
$97.75 $115.00
The 25 papers cover delay testing and test scheduling, scan and functional testing, system testing, quiescent current testing, analog and mixed-signal testing, core-based testing, fault simulation and field programmable gate array testing, challenges in deep sub-micron testing, high level tests, mem

Binding Type: Paperback
Publisher: IEEE Computer Society Press
Published: 11/01/2000
ISBN: 9780769507019
Pages: 181

Review Citations: Scitech Book News 12/01/2000 pg. 154