{"product_id":"european-test-workshop-etw-2000-postproceedings-9780769507019","title":"European Test Workshop (Etw 2000) [Postproceedings]","description":"The 25 papers cover delay testing and test scheduling, scan and functional testing, system testing, quiescent current testing, analog and mixed-signal testing, core-based testing, fault simulation and field programmable gate array testing, challenges in deep sub-micron testing, high level tests, mem\u003cbr\u003e\u003cbr\u003e\u003cb\u003eBinding Type:\u003c\/b\u003e Paperback\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e IEEE Computer Society Press\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 11\/01\/2000\u003cbr\u003e\u003cb\u003eISBN:\u003c\/b\u003e 9780769507019\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 181\u003cbr\u003e\u003cbr\u003e\u003cstrong\u003eReview Citations: \u003c\/strong\u003e\u003ci\u003eScitech Book News\u003c\/i\u003e 12\/01\/2000 pg. 154\u003cbr\u003e","brand":"IEEE","offers":[{"title":"Default Title","offer_id":52715393614005,"sku":"9780769507019","price":97.75,"currency_code":"USD","in_stock":false}],"url":"https:\/\/pastforward.org\/products\/european-test-workshop-etw-2000-postproceedings-9780769507019","provider":"Past Forward","version":"1.0","type":"link"}